Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Name: Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Brand: www.ecard-tech.com.tw
SKU: SKU165724
Price: 9.99 USD
Availability: InStock
Rating: 4.4 (970 reviews)

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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, Pre-Owned in GOOD condition. Book has assorted underlining and high-lighting. May contain inscriptions on inside of front or back cover.Shipped with USPS Media Mail.

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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Pre-Owned in GOOD condition. Book has certain underlining and high-lighting. May contain inscriptions on inside of front or back cover.
Shipped with USPS Media Mail.

This product is superb for anyone looking for quality Outdoor products.